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Verisurf

Verisurf ® 3D Measurement Software

Verisurf 3D Measurement

What Makes Us Different!

  • Quickly learned and retained by new users thanks to intuitive user interface with rich visual experience.
  • Automate quality processes with repeatable measurement plans for any portable, manual or programable CMM.
  • Teach programs or create them from CAD for measurable reduction in programming time and process execution.
  • Run CMMs with Renishaw, Mitutoyo, Hexagon, Zeiss, or Pantec controllers, create reports and connect to quality databases.
Verisurf 3D Measurement

EXPLORE BENEFITS & FEATURES

How we help you program, measure, report and communicate.

Open System Freedom

  • Intuitive user experience makes it easy to learn, remember and support.
  • Model Based Definition speeds tolerancing, programming and reporting.
  • Create repeatable measurement programs for scanners, manual, portable or CNC CMMs.
  • Measurement device freedom eliminates bottlenecks and lowers costs.

Object Oriented Programming

  • Create programs in Teach Mode or by selecting CAD surfaces, points, and features.
  • Intelligent probe management including indexing and racks.
  • Dynamic path visualization, simulation and editing for collision avoidance.
  • Support for 3-axis and 5-axis, touch trigger and tactile scanning probe systems.

Quality Reporting & Communication

  • Create rich inspection reports with standard or custom formats with your branding.
  • Quickly identify quality issues and export or write measurement data to quality management systems for immediate notification.
  • Automate first article inspection reports or production inspection with statistical process control and real-time quality dashboards.

Connect & Operate CMMs

  • Standard communication protocols and formats include: Renishaw UCCserver™, I++ DME, DMIS, and G-Code.
  • Optional Universal CMM software to run proprietary controllers from DEA, Leitz, Mitutoyo, Hexagon, Zeiss, Wenzel, LK, Nikon, and Pantec. Optional error mapping to compensate for geometric, volumetric, orientation, positioning, and kinematic errors.

Verisurf Supports Renishaw 5-Axis Excellence with Revo2 and PH20

Advanced Probing Powered by Verisurf Software
Real-time, visually detailed graphics make path control and collision avoidance second nature with Verisurf’s modern, adaptive user experience.
Revo2 5 Axis Scanning
Revo2 5 Axis Scanning
PH20 5-Axis Touch Trigger
PH20 5-Axis Touch Trigger

KEY BENEFITS

Along with modern CMM head, sensor, and controller technologies, new 5-axis pathing methods from Verisurf software deliver high-performance measuring speed and flexibility.
Five-axis motion allows the stylus to follow a continuous path along complex contours without leaving the part surface to index the probe angle or change the stylus.
There are extensive productivity gains offered by 5-axis probing, as it dramatically reduces the number of setups and special fixturing. It also allows fewer probe changes and the need for custom probes.
  • 5-axis measurement technology achieves 15% to 50% cycle time savings
  • Minimizes the dynamic effects of CMM motion at high measurement speeds.
  • Ideal for complex, 5-axis machined, mill-turned, or additive manufactured parts.
  • Up to 5 times faster to program and setup a 5-axis versus 3-axis CMM

Verisurf fully supports Renishaw RUP Ultrasonic Probe and Renishaw Surface Finish Probing

Advanced Probing Powered by Verisurf Software
Real-time, visually detailed graphics make path control and collision avoidance second nature with Verisurf’s modern, adaptive user experience.

Verisurf Software programs & Renishaw REVO RUP1 (Renishaw Ultrasonic Probe)

Verisurf Software programs and operates CNC CMMs equipped with Renishaw REVO RUP1 (Renishaw Ultrasonic Probe) to measure and report on material thickness at defined points. Report with 10 μm accuracy using Renishaw® REVO® RUP1 probe.

Verisurf CMM Programming with Renishaw REVO SFP2 probe

Using direct output from the Renishaw REVO SFP2 probe, Verisurf CMM programming can include defined surface finish/roughness evaluation from 6.3 μm to 0.05 μm (250 μin to 2 μin) Ra with results added to automated quality reporting. Surface finish measurement is fully integrated with the standard Verisurf CMM inspection program which includes automatic changing of probes minimizing CMM downtime and maximizing inspection throughput.